NanoDAC - A new Technique for Deformation Measurement from Micro to Nano Scale
NanoDAC is a new approach for displacement and in-plane strain field measurement based on scanning probe microscopy images (nanoDAC, nano Deformation Analysis by Correlation). In-situ atomic force microscopy scans are carried out at the surface of objects subjected to different thermo-mechanical load states. Locally applied correlation algorithms are used to track image patterns and to obtain incremental displacement values.
The results of the nanoDAC technique are in-plane displacement fields ux(x,y) and uy(x,y). The figure above illustrates the measured displacement field at a crack tip of a thermoset polymer. The crack opening field is shown as contour lines of equal displacement in y-direction and the scanned surface is shown in the background of the image.
Applications of nanoDAC are thermo-mechanical reliability studies of MEMS and NEMS and the mechanical qualification of newly developed nanomaterials for electronic packaging.
Further application areas are focused on:
- Micro- and nanoscale in-situ deformation measurements.
- Verification of nanomechanical approaches.
- Fracture properties of micro- and nanomaterials.
- Measurement of coefficient of thermal expansion (CTE).
- Tracking of nanomanipulated objects.
- Interface Problems of ultrathin layers
Your contact for further information:
Prof. Dr. Bernd Michel
Micro Materials Center Chemnitz
fon: +49 - 371 - 866 2020
fax: +49 - 371 - 866 2021